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X-eye NF120 inspection system

Catalog no.: SX-NF120

X-eye NF120 inspection system
X-eye NF120 inspection system

X-eye NF120 inspection system

Catalog no.: SX-NF120

Price available
upon request

Manufacturer: SEC

Delivery 14 - 21 days
  • Description
  • Ask for product
  • Responsible
    person
  • General information

    • Nano - focus Tube of 200 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub - micron defect. Able to trace and inspect defected area precisely by precise movement of axis with Antivibration table. - Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loadeing to inspection with wafer handler systems.
    • Name:
      Dział sprzedaży
    • E-mail:
      sklep@renex.pl
    • Address:
      Al. Kazimierza Wielkiego 6E
    • Postal code:
      87-800
    • City:
      Włocławek
    • Country:
      Poland
    Description

    General information

    • Nano - focus Tube of 200 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub - micron defect. Able to trace and inspect defected area precisely by precise movement of axis with Antivibration table. - Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loadeing to inspection with wafer handler systems.
    Ask for product
    Responsible
    person
    • Name:
      Dział sprzedaży
    • E-mail:
      sklep@renex.pl
    • Address:
      Al. Kazimierza Wielkiego 6E
    • Postal code:
      87-800
    • City:
      Włocławek
    • Country:
      Poland

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