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X-eye NF120 inspection system
Catalog no.: SX-NF120
X-eye NF120 inspection system
Catalog no.: SX-NF120
Price available
upon request
Manufacturer: SEC
Delivery 14 - 21 days
- Description
- Ask for product
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Responsible
person
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General information
- Nano - focus Tube of 200 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub - micron defect. Able to trace and inspect defected area precisely by precise movement of axis with Antivibration table. - Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loadeing to inspection with wafer handler systems.
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Name:Dział sprzedaży
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E-mail:sklep@renex.pl
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Address:Al. Kazimierza Wielkiego 6E
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Postal code:87-800
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City:Włocławek
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Country:Poland
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- Nano - focus Tube of 200 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub - micron defect. Able to trace and inspect defected area precisely by precise movement of axis with Antivibration table. - Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loadeing to inspection with wafer handler systems.
-
Name:Dział sprzedaży
-
E-mail:sklep@renex.pl
-
Address:Al. Kazimierza Wielkiego 6E
-
Postal code:87-800
-
City:Włocławek
-
Country:Poland
Description
General information
Ask for product
Responsible
person
person