General information
Software for TAGARNO TREND and PRESTIGE microscopes
The DXF Overlay application allows you to control a sample using the DXF file as an image on the monitor. By simply adding the file and using it as a sample overlay, you can easily see the sample and DXF file simultaneously on screen in real time.
One of the biggest advantages of the application is the search bar, which can be used to find specific parts in a sample. This makes it easy for the user to find a component that may be defective or requires more thorough inspection
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- Name:
  
  Dział sprzedaży
- E-mail:
  
  sklep@renex.pl
- Address:
  
  Al. Kazimierza Wielkiego 6E
- Postal code:
  
  87-800
- City:
  
  Włocławek
- Country:
  
  Poland

Description

General information

Software for TAGARNO TREND and PRESTIGE microscopes
The DXF Overlay application allows you to control a sample using the DXF file as an image on the monitor. By simply adding the file and using it as a sample overlay, you can easily see the sample and DXF file simultaneously on screen in real time.
One of the biggest advantages of the application is the search bar, which can be used to find specific parts in a sample. This makes it easy for the user to find a component that may be defective or requires more thorough inspection

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