Categories

Scanning electron microscope

Catalog no.: SX-SNE 4500M PLUS B

Scanning electron microscope
Scanning electron microscope

Scanning electron microscope

Catalog no.: SX-SNE 4500M PLUS B

Price available
upon request

Manufacturer: SEC

Delivery 14 - 21 days
  • Description
  • Ask for product
  • Responsible
    person
  • General information

    • - The SNE 4500M PLUS B model provides ease of use and the highest performance among SEM systems offered by SEC.
    • Thanks to the fully motorized preparation holder and the top CCD camera, manipulating the sample and determining its precise position is extremely easy and fast. - SNE 4500M PLUS B offers a magnification range of up to 150,000 x and is the optimum solution for cross - sectional analysis or surface studies due to the wide range of compositional analysis tools available.
    • Name:
      Dział sprzedaży
    • E-mail:
      sklep@renex.pl
    • Address:
      Al. Kazimierza Wielkiego 6E
    • Postal code:
      87-800
    • City:
      Włocławek
    • Country:
      Poland
    Description

    General information

    • - The SNE 4500M PLUS B model provides ease of use and the highest performance among SEM systems offered by SEC.
    • Thanks to the fully motorized preparation holder and the top CCD camera, manipulating the sample and determining its precise position is extremely easy and fast. - SNE 4500M PLUS B offers a magnification range of up to 150,000 x and is the optimum solution for cross - sectional analysis or surface studies due to the wide range of compositional analysis tools available.
    Ask for product
    Responsible
    person
    • Name:
      Dział sprzedaży
    • E-mail:
      sklep@renex.pl
    • Address:
      Al. Kazimierza Wielkiego 6E
    • Postal code:
      87-800
    • City:
      Włocławek
    • Country:
      Poland

Recommended products: