Categories
Scanning electron microscope
Catalog no.: SX-SNE 3200M
Scanning electron microscope
Catalog no.: SX-SNE 3200M
Price available
upon request
Manufacturer: SEC
Delivery 14 - 21 days
- Description
- Ask for product
-
Responsible
person
-
General information
- The system uses two detectors - SE and BSE - for SEM image analysis, providing comprehensive testing capabilities for a wide range of sample types. - Both high and low vacuum modes (with voltage reduction) are standard, allowing the analysis of non - conductive samples without metallic coating.
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Name:Dział sprzedaży
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E-mail:sklep@renex.pl
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Address:Al. Kazimierza Wielkiego 6E
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Postal code:87-800
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City:Włocławek
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Country:Poland
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- The system uses two detectors - SE and BSE - for SEM image analysis, providing comprehensive testing capabilities for a wide range of sample types. - Both high and low vacuum modes (with voltage reduction) are standard, allowing the analysis of non - conductive samples without metallic coating.
-
Name:Dział sprzedaży
-
E-mail:sklep@renex.pl
-
Address:Al. Kazimierza Wielkiego 6E
-
Postal code:87-800
-
City:Włocławek
-
Country:Poland
Description
General information
Ask for product
Responsible
person
person