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Scanning electron microscope

Catalog no.: SX-SNE 3200M

Scanning electron microscope
Scanning electron microscope

Scanning electron microscope

Catalog no.: SX-SNE 3200M

Price available
upon request

Manufacturer: SEC

Delivery 14 - 21 days
  • Description
  • Ask for product
  • Responsible
    person
  • General information

    • The system uses two detectors - SE and BSE - for SEM image analysis, providing comprehensive testing capabilities for a wide range of sample types. - Both high and low vacuum modes (with voltage reduction) are standard, allowing the analysis of non - conductive samples without metallic coating.
    • Name:
      Dział sprzedaży
    • E-mail:
      sklep@renex.pl
    • Address:
      Al. Kazimierza Wielkiego 6E
    • Postal code:
      87-800
    • City:
      Włocławek
    • Country:
      Poland
    Description

    General information

    • The system uses two detectors - SE and BSE - for SEM image analysis, providing comprehensive testing capabilities for a wide range of sample types. - Both high and low vacuum modes (with voltage reduction) are standard, allowing the analysis of non - conductive samples without metallic coating.
    Ask for product
    Responsible
    person
    • Name:
      Dział sprzedaży
    • E-mail:
      sklep@renex.pl
    • Address:
      Al. Kazimierza Wielkiego 6E
    • Postal code:
      87-800
    • City:
      Włocławek
    • Country:
      Poland

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