Categories
Scanning electron microscope
Catalog no.: SX-SNE 4500M
Scanning electron microscope
Catalog no.: SX-SNE 4500M
Price available
upon request
Manufacturer: SEC
Delivery 14 - 21 days
- Description
- Ask for product
-
Responsible
person
-
General information
- The high resolving capacity of the system allows for real - time inspection of samples and for an magnification of up to 100,000x.
- High - quality images of extremely small parts and particles can be achieved by using a standard variable aperture (30, 50, 100 µm) and optimal sample positioning with an omnidirectional 5 - axis range of gripping motion.
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Name:Dział sprzedaży
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E-mail:sklep@renex.pl
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Address:Al. Kazimierza Wielkiego 6E
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Postal code:87-800
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City:Włocławek
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Country:Poland
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- The high resolving capacity of the system allows for real - time inspection of samples and for an magnification of up to 100,000x.
- High - quality images of extremely small parts and particles can be achieved by using a standard variable aperture (30, 50, 100 µm) and optimal sample positioning with an omnidirectional 5 - axis range of gripping motion.
-
Name:Dział sprzedaży
-
E-mail:sklep@renex.pl
-
Address:Al. Kazimierza Wielkiego 6E
-
Postal code:87-800
-
City:Włocławek
-
Country:Poland
Description
General information
Ask for product
Responsible
person
person